Colakoglu, T. And PARLAK, M. 2008. Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique. APPLIED SURFACE SCIENCE , vol.254, no.6 , 1569-1577.

Colakoglu, T., & PARLAK, M., (2008). Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique. APPLIED SURFACE SCIENCE , vol.254, no.6, 1569-1577.

Colakoglu, T., And MEHMET PARLAK. "Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique," APPLIED SURFACE SCIENCE , vol.254, no.6, 1569-1577, 2008

Colakoglu, T. And PARLAK, MEHMET. "Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique." APPLIED SURFACE SCIENCE , vol.254, no.6, pp.1569-1577, 2008

Colakoglu, T. And PARLAK, M. (2008) . "Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique." APPLIED SURFACE SCIENCE , vol.254, no.6, pp.1569-1577.

@article{article, author={T. Colakoglu And author={MEHMET PARLAK}, title={Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique}, journal={APPLIED SURFACE SCIENCE}, year=2008, pages={1569-1577} }