ÇIRÇIR, K. Et Al. 2018. Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors. Quantum Structure Infrared Photodetector International Conference QSIP 2018 .

ÇIRÇIR, K., Dolaş, M. H., & KOCAMAN, S., (2018). Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors . Quantum Structure Infrared Photodetector International Conference QSIP 2018

ÇIRÇIR, KÜBRA, M Halit Dolaş, And SERDAR KOCAMAN. "Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors," Quantum Structure Infrared Photodetector International Conference QSIP 2018, 2018

ÇIRÇIR, KÜBRA Et Al. "Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors." Quantum Structure Infrared Photodetector International Conference QSIP 2018 , 2018

ÇIRÇIR, K. Dolaş, M. H. And KOCAMAN, S. (2018) . "Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors." Quantum Structure Infrared Photodetector International Conference QSIP 2018 .

@conferencepaper{conferencepaper, author={KÜBRA ÇIRÇIR Et Al. }, title={Characterization of Depleted In-Device Passivation Layer for InGaAs Photodetectors}, congress name={Quantum Structure Infrared Photodetector International Conference QSIP 2018}, city={}, country={}, year={2018}}