Mogaddam, N. A. P. Et Al. 2008. Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing. JOURNAL OF APPLIED PHYSICS , vol.104, no.12 .

Mogaddam, N. A. P., Alagoz, A. S., YERCİ, S., TURAN, R., FOSS, S., & Finstad, T. G., (2008). Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing. JOURNAL OF APPLIED PHYSICS , vol.104, no.12.

Mogaddam, N. Et Al. "Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing," JOURNAL OF APPLIED PHYSICS , vol.104, no.12, 2008

Mogaddam, N. A. Et Al. "Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing." JOURNAL OF APPLIED PHYSICS , vol.104, no.12, 2008

Mogaddam, N. A. P. Et Al. (2008) . "Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing." JOURNAL OF APPLIED PHYSICS , vol.104, no.12.

@article{article, author={N. A. P. Mogaddam Et Al. }, title={Phase separation in SiGe nanocrystals embedded in SiO2 matrix during high temperature annealing}, journal={JOURNAL OF APPLIED PHYSICS}, year=2008}