Gullu, H. H. Et Al. 2019. Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.10 , 9814-9821.

Gullu, H. H., Surucu, O. B., TERLEMEZOĞLU, M., Yildiz, D. E., & PARLAK, M., (2019). Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.10, 9814-9821.

Gullu, H. Et Al. "Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.10, 9814-9821, 2019

Gullu, H. H. Et Al. "Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.10, pp.9814-9821, 2019

Gullu, H. H. Et Al. (2019) . "Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.10, pp.9814-9821.

@article{article, author={H. H. Gullu Et Al. }, title={Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2019, pages={9814-9821} }