U. Demirok Et Al. , "Time-resolved XPS analysis of the SiO2/Si system in the millisecond range," JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17, pp.5179-5181, 2004
Demirok, U. Et Al. 2004. Time-resolved XPS analysis of the SiO2/Si system in the millisecond range. JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17 , 5179-5181.
Demirok, U., Ertas, G., & Suzer, S., (2004). Time-resolved XPS analysis of the SiO2/Si system in the millisecond range. JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17, 5179-5181.
Demirok, UK, GÜLAY ERTAŞ, And S Suzer. "Time-resolved XPS analysis of the SiO2/Si system in the millisecond range," JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17, 5179-5181, 2004
Demirok, UK Et Al. "Time-resolved XPS analysis of the SiO2/Si system in the millisecond range." JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17, pp.5179-5181, 2004
Demirok, U. Ertas, G. And Suzer, S. (2004) . "Time-resolved XPS analysis of the SiO2/Si system in the millisecond range." JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.17, pp.5179-5181.
@article{article, author={UK Demirok Et Al. }, title={Time-resolved XPS analysis of the SiO2/Si system in the millisecond range}, journal={JOURNAL OF PHYSICAL CHEMISTRY B}, year=2004, pages={5179-5181} }