Suren, E. Et Al. 2019. I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, no.5 , 3713-3728.

Suren, E., ANGIN, P., & BAYKAL, N., (2019). I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, no.5, 3713-3728.

Suren, Emre, PELİN ANGIN ÜLKÜER, And NAZİFE BAYKAL. "I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, no.5, 3713-3728, 2019

Suren, Emre Et Al. "I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, no.5, pp.3713-3728, 2019

Suren, E. ANGIN, P. And BAYKAL, N. (2019) . "I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.27, no.5, pp.3713-3728.

@article{article, author={Emre Suren Et Al. }, title={I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains}, journal={TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES}, year=2019, pages={3713-3728} }