Isik, M. Et Al. 2020. Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.120 .

Isik, M., Delice, S., Nasser, H., HASANLI, N., Darvishov, N. H., & Bagiev, V. E., (2020). Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.120.

Isik, M. Et Al. "Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry," MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.120, 2020

Isik, M. Et Al. "Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.120, 2020

Isik, M. Et Al. (2020) . "Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.120.

@article{article, author={M. Isik Et Al. }, title={Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry}, journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, year=2020}