Oral, A. Et Al. 2003. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.74, no.8 , 3656-3663.

Oral, A., GRIMBLE, R., ÖZER, H. Ö., & PETHICA, J., (2003). High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.74, no.8, 3656-3663.

Oral, AHMET Et Al. "High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy," REVIEW OF SCIENTIFIC INSTRUMENTS , vol.74, no.8, 3656-3663, 2003

Oral, AHMET Et Al. "High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.74, no.8, pp.3656-3663, 2003

Oral, A. Et Al. (2003) . "High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.74, no.8, pp.3656-3663.

@article{article, author={AHMET ORAL Et Al. }, title={High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy}, journal={REVIEW OF SCIENTIFIC INSTRUMENTS}, year=2003, pages={3656-3663} }