GÜLLÜ, H. H. And PARLAK, M. 2016. Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8. EMRS Spring Meeting in Lille April 30-May 5 2016 , (Lille, France).

GÜLLÜ, H. H., & PARLAK, M., (2016). Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8 . EMRS Spring Meeting in Lille April 30-May 5 2016, Lille, France

GÜLLÜ, HASAN, And MEHMET PARLAK. "Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8," EMRS Spring Meeting in Lille April 30-May 5 2016, Lille, France, 2016

GÜLLÜ, HASAN H. And PARLAK, MEHMET. "Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8." EMRS Spring Meeting in Lille April 30-May 5 2016 , Lille, France, 2016

GÜLLÜ, H. H. And PARLAK, M. (2016) . "Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8." EMRS Spring Meeting in Lille April 30-May 5 2016 , Lille, France.

@conferencepaper{conferencepaper, author={HASAN HÜSEYİN GÜLLÜ And author={MEHMET PARLAK}, title={Device Characterization of In p Cu0 5Ag0 5InSe2 n Si Ag Heterojunction Diode V P2 8}, congress name={EMRS Spring Meeting in Lille April 30-May 5 2016}, city={Lille}, country={France}, year={2016}}