M. Isik Et Al. , "Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements," PHYSICA SCRIPTA , vol.96, no.12, 2021
Isik, M. Et Al. 2021. Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements. PHYSICA SCRIPTA , vol.96, no.12 .
Isik, M., Delice, S., & HASANLI, N., (2021). Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements. PHYSICA SCRIPTA , vol.96, no.12.
Isik, M., S. Delice, And NIZAMI HASANLI. "Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements," PHYSICA SCRIPTA , vol.96, no.12, 2021
Isik, M. Et Al. "Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements." PHYSICA SCRIPTA , vol.96, no.12, 2021
Isik, M. Delice, S. And HASANLI, N. (2021) . "Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements." PHYSICA SCRIPTA , vol.96, no.12.
@article{article, author={M. Isik Et Al. }, title={Investigation of defect levels in Bi12SiO20 single crystals by thermally stimulated current measurements}, journal={PHYSICA SCRIPTA}, year=2021}