Gullu, H. H. And PARLAK, M. 2019. Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction. JOURNAL OF ELECTRONIC MATERIALS , vol.48, no.5 , 3096-3104.

Gullu, H. H., & PARLAK, M., (2019). Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction. JOURNAL OF ELECTRONIC MATERIALS , vol.48, no.5, 3096-3104.

Gullu, HASAN, And MEHMET PARLAK. "Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction," JOURNAL OF ELECTRONIC MATERIALS , vol.48, no.5, 3096-3104, 2019

Gullu, HASAN H. And PARLAK, MEHMET. "Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction." JOURNAL OF ELECTRONIC MATERIALS , vol.48, no.5, pp.3096-3104, 2019

Gullu, H. H. And PARLAK, M. (2019) . "Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction." JOURNAL OF ELECTRONIC MATERIALS , vol.48, no.5, pp.3096-3104.

@article{article, author={HASAN HÜSEYİN GÜLLÜ And author={MEHMET PARLAK}, title={Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2019, pages={3096-3104} }