YERCİ, S. Et Al. Characterization of Si Nanocrystals. 2010. In Silicon Nanocrystals Fundamentals Synthesis and Applications , Wiley -VCH, Weinheim, 583-611.

YERCİ, S., DOĞAN, İ., SEYHAN, A., ARİFE, G., & TURAN, R., (2010). Characterization of Si Nanocrystals. Silicon Nanocrystals Fundamentals Synthesis and Applications (pp.583-611), Weinheim: Wiley -VCH.

YERCİ, SELÇUK Et Al. "Characterization of Si Nanocrystals." In Silicon Nanocrystals Fundamentals Synthesis and Applications , 583-611. Weinheim: Wiley -VCH, 2010

YERCİ, SELÇUK Et Al. "Characterization of Si Nanocrystals." Silicon Nanocrystals Fundamentals Synthesis and Applications , Wiley -VCH, 2010, pp.583-611.

YERCİ, S. Et Al. (2010) "Characterization of Si Nanocrystals", Silicon Nanocrystals Fundamentals Synthesis and Applications . Weinheim: Wiley -VCH.

@bookchapter{bookchapter, author ={SELÇUK YERCİ Et Al. }, chaptertitle={Characterization of Si Nanocrystals}, booktitle={ Silicon Nanocrystals Fundamentals Synthesis and Applications}, publisher={Wiley -VCH}, city={Weinheim},year={2010} }