O. Ozdemir Et Al. , "Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses," JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296, pp.27-38, 2001
Ozdemir, O. Et Al. 2001. Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses. JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296 , 27-38.
Ozdemir, O., Atilgan, I., & Katircioglu, B., (2001). Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses. JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296, 27-38.
Ozdemir, O, I Atilgan, And B Katircioglu. "Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses," JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296, 27-38, 2001
Ozdemir, O Et Al. "Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses." JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296, pp.27-38, 2001
Ozdemir, O. Atilgan, I. And Katircioglu, B. (2001) . "Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses." JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.296, pp.27-38.
@article{article, author={O Ozdemir Et Al. }, title={Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses}, journal={JOURNAL OF NON-CRYSTALLINE SOLIDS}, year=2001, pages={27-38} }