T. Ogurtani And E. Oren, "Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects," JOURNAL OF APPLIED PHYSICS , vol.90, no.3, pp.1564-1572, 2001
Ogurtani, T. And Oren, E. 2001. Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects. JOURNAL OF APPLIED PHYSICS , vol.90, no.3 , 1564-1572.
Ogurtani, T., & Oren, E., (2001). Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects. JOURNAL OF APPLIED PHYSICS , vol.90, no.3, 1564-1572.
Ogurtani, TO, And EE Oren. "Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects," JOURNAL OF APPLIED PHYSICS , vol.90, no.3, 1564-1572, 2001
Ogurtani, TO And Oren, EE. "Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects." JOURNAL OF APPLIED PHYSICS , vol.90, no.3, pp.1564-1572, 2001
Ogurtani, T. And Oren, E. (2001) . "Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects." JOURNAL OF APPLIED PHYSICS , vol.90, no.3, pp.1564-1572.
@article{article, author={TO Ogurtani And author={EE Oren}, title={Computer simulation of void growth dynamics under the action of electromigration and capillary forces in narrow thin interconnects}, journal={JOURNAL OF APPLIED PHYSICS}, year=2001, pages={1564-1572} }