Nye, B. Et Al. 2017. Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System. 18th International Conference on Artificial Intelligence in Education (AIED) , (Wuhan, China), 544-547.

Nye, B., Karumbaiah, S., TOKEL, S. T., Core, M. G., Stratou, G., Auerbach, D., ... Georgila, K.(2017). Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System . 18th International Conference on Artificial Intelligence in Education (AIED) (pp.544-547). Wuhan, China

Nye, Benjamin Et Al. "Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System," 18th International Conference on Artificial Intelligence in Education (AIED), Wuhan, China, 2017

Nye, Benjamin Et Al. "Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System." 18th International Conference on Artificial Intelligence in Education (AIED) , Wuhan, China, pp.544-547, 2017

Nye, B. Et Al. (2017) . "Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System." 18th International Conference on Artificial Intelligence in Education (AIED) , Wuhan, China, pp.544-547.

@conferencepaper{conferencepaper, author={Benjamin Nye Et Al. }, title={Analyzing Learner Affect in a Scenario-Based Intelligent Tutoring System}, congress name={18th International Conference on Artificial Intelligence in Education (AIED)}, city={Wuhan}, country={China}, year={2017}, pages={544-547} }