Dogan, I. Et Al. 2009. PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES , vol.41, no.6 , 976-981.

Dogan, I., YILDIZ, İ., & TURAN, R., (2009). PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES , vol.41, no.6, 976-981.

Dogan, I., İLKER YILDIZ, And RAŞİT TURAN. "PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals," PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES , vol.41, no.6, 976-981, 2009

Dogan, I. Et Al. "PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals." PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES , vol.41, no.6, pp.976-981, 2009

Dogan, I. YILDIZ, İ. And TURAN, R. (2009) . "PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals." PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES , vol.41, no.6, pp.976-981.

@article{article, author={I. Dogan Et Al. }, title={PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the formation of silicon nanocrystals}, journal={PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES}, year=2009, pages={976-981} }