Yerci, S. Et Al. 2007. Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation. JOURNAL OF APPLIED PHYSICS , vol.102, no.2 .

Yerci, S., Yildiz, I., KULAKCI, M., SERİNCAN, U., BAROZZİ, M., BERSANİ, M., ... Turan, R.(2007). Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation. JOURNAL OF APPLIED PHYSICS , vol.102, no.2.

Yerci, SELÇUK Et Al. "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation," JOURNAL OF APPLIED PHYSICS , vol.102, no.2, 2007

Yerci, SELÇUK Et Al. "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation." JOURNAL OF APPLIED PHYSICS , vol.102, no.2, 2007

Yerci, S. Et Al. (2007) . "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation." JOURNAL OF APPLIED PHYSICS , vol.102, no.2.

@article{article, author={SELÇUK YERCİ Et Al. }, title={Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation}, journal={JOURNAL OF APPLIED PHYSICS}, year=2007}