Mayandi, J. Et Al. 2007. Scanning probe measurements on luminescent Si nanoclusters in SiO2 films. THIN SOLID FILMS , vol.515, no.16 , 6375-6380.

Mayandi, J., Finstad, T. G., Thogersen, A., Foss, S., Serincan, U., & Turan, R., (2007). Scanning probe measurements on luminescent Si nanoclusters in SiO2 films. THIN SOLID FILMS , vol.515, no.16, 6375-6380.

Mayandi, J. Et Al. "Scanning probe measurements on luminescent Si nanoclusters in SiO2 films," THIN SOLID FILMS , vol.515, no.16, 6375-6380, 2007

Mayandi, J. Et Al. "Scanning probe measurements on luminescent Si nanoclusters in SiO2 films." THIN SOLID FILMS , vol.515, no.16, pp.6375-6380, 2007

Mayandi, J. Et Al. (2007) . "Scanning probe measurements on luminescent Si nanoclusters in SiO2 films." THIN SOLID FILMS , vol.515, no.16, pp.6375-6380.

@article{article, author={J. Mayandi Et Al. }, title={Scanning probe measurements on luminescent Si nanoclusters in SiO2 films}, journal={THIN SOLID FILMS}, year=2007, pages={6375-6380} }