S. Ozerinc Et Al. , "Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2," JOURNAL OF APPLIED PHYSICS , vol.117, no.2, 2015
Ozerinc, S. Et Al. 2015. Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2. JOURNAL OF APPLIED PHYSICS , vol.117, no.2 .
Ozerinc, S., KİM, H. J., Averback, R. S., & King, W. P., (2015). Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2. JOURNAL OF APPLIED PHYSICS , vol.117, no.2.
Ozerinc, SEZER Et Al. "Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2," JOURNAL OF APPLIED PHYSICS , vol.117, no.2, 2015
Ozerinc, SEZER Et Al. "Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2." JOURNAL OF APPLIED PHYSICS , vol.117, no.2, 2015
Ozerinc, S. Et Al. (2015) . "Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2." JOURNAL OF APPLIED PHYSICS , vol.117, no.2.
@article{article, author={SEZER ÖZERİNÇ Et Al. }, title={Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2}, journal={JOURNAL OF APPLIED PHYSICS}, year=2015}