Pehlivan, O. Et Al. 2015. Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling. CHINESE JOURNAL OF PHYSICS , vol.53, no.3 .

Pehlivan, O., KARATAŞ, S., Yilmaz, O., Kodolbas, A. O., Duygulu, O., DUYGULU, N., ... İSKENDER, İ.(2015). Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling. CHINESE JOURNAL OF PHYSICS , vol.53, no.3.

Pehlivan, O. Et Al. "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling," CHINESE JOURNAL OF PHYSICS , vol.53, no.3, 2015

Pehlivan, O. Et Al. "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling." CHINESE JOURNAL OF PHYSICS , vol.53, no.3, 2015

Pehlivan, O. Et Al. (2015) . "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling." CHINESE JOURNAL OF PHYSICS , vol.53, no.3.

@article{article, author={O. Pehlivan Et Al. }, title={Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling}, journal={CHINESE JOURNAL OF PHYSICS}, year=2015}