ÜNAL, M. Et Al. 2017. An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process. THIN SOLID FILMS , vol.640 , 38-44.

ÜNAL, M., Tankut, A., YILDIZ, İ., Sokmen, I., & TURAN, R., (2017). An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process. THIN SOLID FILMS , vol.640, 38-44.

ÜNAL, MUSTAFA Et Al. "An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process," THIN SOLID FILMS , vol.640, 38-44, 2017

ÜNAL, MUSTAFA Et Al. "An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process." THIN SOLID FILMS , vol.640, pp.38-44, 2017

ÜNAL, M. Et Al. (2017) . "An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process." THIN SOLID FILMS , vol.640, pp.38-44.

@article{article, author={MUSTAFA ÜNAL Et Al. }, title={An X-ray photoelectron spectroscopy study on the annealing effects for Al/glass Interface during aluminum induced texturing process}, journal={THIN SOLID FILMS}, year=2017, pages={38-44} }