COŞKUN, E. Et Al. 2019. Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.5 , 4760-4765.

COŞKUN, E., Gullu, H. H., Colakoglu, T., Emir, C., Bozdogan, E., & PARLAK, M., (2019). Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.5, 4760-4765.

COŞKUN, EMRE Et Al. "Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.5, 4760-4765, 2019

COŞKUN, EMRE Et Al. "Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.5, pp.4760-4765, 2019

COŞKUN, E. Et Al. (2019) . "Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.30, no.5, pp.4760-4765.

@article{article, author={EMRE COŞKUN Et Al. }, title={Effects of Si nanowire on the device properties of n-ZnSe/p-Si heterostructure}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2019, pages={4760-4765} }