Guler, I. Et Al. 2023. Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices. Journal of Materials Science: Materials in Electronics , vol.34, no.17 .

Guler, I., Isik, M., & HASANLI, N., (2023). Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices. Journal of Materials Science: Materials in Electronics , vol.34, no.17.

Guler, I., M. Isik, And NIZAMI HASANLI. "Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices," Journal of Materials Science: Materials in Electronics , vol.34, no.17, 2023

Guler, I. Et Al. "Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices." Journal of Materials Science: Materials in Electronics , vol.34, no.17, 2023

Guler, I. Isik, M. And HASANLI, N. (2023) . "Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices." Journal of Materials Science: Materials in Electronics , vol.34, no.17.

@article{article, author={I. Guler Et Al. }, title={Optical characterization of (TlInS2)0.5(TlInSe2)0.5 crystal by ellipsometry: linear and optical constants for optoelectronic devices}, journal={Journal of Materials Science: Materials in Electronics}, year=2023}