Ogurtani, T. O. 2009. The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films. JOURNAL OF APPLIED PHYSICS , vol.106, no.5 .

Ogurtani, T. O., (2009). The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films. JOURNAL OF APPLIED PHYSICS , vol.106, no.5.

Ogurtani, Tarik. "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films," JOURNAL OF APPLIED PHYSICS , vol.106, no.5, 2009

Ogurtani, Tarik O. . "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films." JOURNAL OF APPLIED PHYSICS , vol.106, no.5, 2009

Ogurtani, T. O. (2009) . "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films." JOURNAL OF APPLIED PHYSICS , vol.106, no.5.

@article{article, author={Tarik Omer Ogurtani}, title={The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films}, journal={JOURNAL OF APPLIED PHYSICS}, year=2009}