T. O. Ogurtani, "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films," JOURNAL OF APPLIED PHYSICS , vol.106, no.5, 2009
Ogurtani, T. O. 2009. The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films. JOURNAL OF APPLIED PHYSICS , vol.106, no.5 .
Ogurtani, T. O., (2009). The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films. JOURNAL OF APPLIED PHYSICS , vol.106, no.5.
Ogurtani, Tarik. "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films," JOURNAL OF APPLIED PHYSICS , vol.106, no.5, 2009
Ogurtani, Tarik O. . "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films." JOURNAL OF APPLIED PHYSICS , vol.106, no.5, 2009
Ogurtani, T. O. (2009) . "The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films." JOURNAL OF APPLIED PHYSICS , vol.106, no.5.
@article{article, author={Tarik Omer Ogurtani}, title={The orientation dependent electromigration induced healing on the surface cracks and roughness caused by the uniaxial compressive stresses in single crystal metallic thin films}, journal={JOURNAL OF APPLIED PHYSICS}, year=2009}