Yasar, B. Et Al. 2018. HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal. JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.1 , 778-784.

Yasar, B., ERGUNT, Y., KABUKCUOGLU, M. P., PARLAK, M., TURAN, R., & KALAY, Y. E., (2018). HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal. JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.1, 778-784.

Yasar, BENGİSU Et Al. "HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal," JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.1, 778-784, 2018

Yasar, BENGİSU Et Al. "HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal." JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.1, pp.778-784, 2018

Yasar, B. Et Al. (2018) . "HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal." JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.1, pp.778-784.

@article{article, author={BENGİSU YAŞAR Et Al. }, title={HRTEM Analysis of Crystallographic Defects in CdZnTe Single Crystal}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2018, pages={778-784} }