Gullu, H. H. Et Al. 2020. Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12 , 9394-9407.

Gullu, H. H., Yildiz, D. E., Surucu, O., & Parlak, M., (2020). Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, 9394-9407.

Gullu, HASAN Et Al. "Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, 9394-9407, 2020

Gullu, HASAN H. Et Al. "Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, pp.9394-9407, 2020

Gullu, H. H. Et Al. (2020) . "Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.12, pp.9394-9407.

@article{article, author={HASAN HÜSEYİN GÜLLÜ Et Al. }, title={Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2020, pages={9394-9407} }