Isik, M. Et Al. 2021. Spectroscopic ellipsometry study of Bi12TiO20 single crystals. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.6 , 7019-7025.

Isik, M., Hasanlı, N., Darvishov, N. H., & Bagiev, V. E., (2021). Spectroscopic ellipsometry study of Bi12TiO20 single crystals. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.6, 7019-7025.

Isik, M. Et Al. "Spectroscopic ellipsometry study of Bi12TiO20 single crystals," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.6, 7019-7025, 2021

Isik, M. Et Al. "Spectroscopic ellipsometry study of Bi12TiO20 single crystals." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.6, pp.7019-7025, 2021

Isik, M. Et Al. (2021) . "Spectroscopic ellipsometry study of Bi12TiO20 single crystals." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.6, pp.7019-7025.

@article{article, author={M. Isik Et Al. }, title={Spectroscopic ellipsometry study of Bi12TiO20 single crystals}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2021, pages={7019-7025} }