Gullu, H. H. And PARLAK, M. 2018. Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.13 , 11258-11264.

Gullu, H. H., & PARLAK, M., (2018). Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.13, 11258-11264.

Gullu, H., And MEHMET PARLAK. "Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.13, 11258-11264, 2018

Gullu, H. H. And PARLAK, MEHMET. "Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.13, pp.11258-11264, 2018

Gullu, H. H. And PARLAK, M. (2018) . "Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.13, pp.11258-11264.

@article{article, author={H. H. Gullu And author={MEHMET PARLAK}, title={Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2018, pages={11258-11264} }