F. Karadas Et Al. , "Differential charging in SiO2/Si system as determined by XPS," JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4, pp.1515-1518, 2004
Karadas, F. Et Al. 2004. Differential charging in SiO2/Si system as determined by XPS. JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4 , 1515-1518.
Karadas, F., Ertas, G., & Suzer, S., (2004). Differential charging in SiO2/Si system as determined by XPS. JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4, 1515-1518.
Karadas, F, GÜLAY ERTAŞ, And S Suzer. "Differential charging in SiO2/Si system as determined by XPS," JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4, 1515-1518, 2004
Karadas, F Et Al. "Differential charging in SiO2/Si system as determined by XPS." JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4, pp.1515-1518, 2004
Karadas, F. Ertas, G. And Suzer, S. (2004) . "Differential charging in SiO2/Si system as determined by XPS." JOURNAL OF PHYSICAL CHEMISTRY B , vol.108, no.4, pp.1515-1518.
@article{article, author={F Karadas Et Al. }, title={Differential charging in SiO2/Si system as determined by XPS}, journal={JOURNAL OF PHYSICAL CHEMISTRY B}, year=2004, pages={1515-1518} }