KARAAĞAÇ, H. Et Al. 2009. Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique. JOURNAL OF PHYSICS D-APPLIED PHYSICS , vol.42, no.16 .

KARAAĞAÇ, H., KALELİ, M., & PARLAK, M., (2009). Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique. JOURNAL OF PHYSICS D-APPLIED PHYSICS , vol.42, no.16.

KARAAĞAÇ, HAKAN, Murat KALELİ, And MEHMET PARLAK. "Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique," JOURNAL OF PHYSICS D-APPLIED PHYSICS , vol.42, no.16, 2009

KARAAĞAÇ, HAKAN Et Al. "Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique." JOURNAL OF PHYSICS D-APPLIED PHYSICS , vol.42, no.16, 2009

KARAAĞAÇ, H. KALELİ, M. And PARLAK, M. (2009) . "Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique." JOURNAL OF PHYSICS D-APPLIED PHYSICS , vol.42, no.16.

@article{article, author={HAKAN KARAAĞAÇ Et Al. }, title={Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique}, journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS}, year=2009}