Kulah, H. Et Al. 2006. Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer. IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.41, no.2 , 352-361.

Kulah, H., Chae, J., Yazdi, N., & Najafi, K., (2006). Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer. IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.41, no.2, 352-361.

Kulah, HALUK Et Al. "Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer," IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.41, no.2, 352-361, 2006

Kulah, HALUK Et Al. "Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer." IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.41, no.2, pp.352-361, 2006

Kulah, H. Et Al. (2006) . "Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer." IEEE JOURNAL OF SOLID-STATE CIRCUITS , vol.41, no.2, pp.352-361.

@article{article, author={HALUK KÜLAH Et Al. }, title={Noise analysis and characterization of a sigma-delta/capacitive microaccelerometer}, journal={IEEE JOURNAL OF SOLID-STATE CIRCUITS}, year=2006, pages={352-361} }