SULAK, F. Et Al. 2017. On the independence of statistical randomness tests included in the NIST test suite. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.25, no.5 , 3673-3683.

SULAK, F., UĞUZ, M., Kocak, O., & DOĞANAKSOY, A., (2017). On the independence of statistical randomness tests included in the NIST test suite. TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.25, no.5, 3673-3683.

SULAK, FATİH Et Al. "On the independence of statistical randomness tests included in the NIST test suite," TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.25, no.5, 3673-3683, 2017

SULAK, FATİH Et Al. "On the independence of statistical randomness tests included in the NIST test suite." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.25, no.5, pp.3673-3683, 2017

SULAK, F. Et Al. (2017) . "On the independence of statistical randomness tests included in the NIST test suite." TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES , vol.25, no.5, pp.3673-3683.

@article{article, author={FATİH SULAK Et Al. }, title={On the independence of statistical randomness tests included in the NIST test suite}, journal={TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES}, year=2017, pages={3673-3683} }