SANDHU, A. Et Al. 2004. 50 nm Hall sensors for room temperature scanning Hall probe microscopy. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , vol.43, no.2 , 777-778.

SANDHU, A., KUROSAWA, K., DEDE, M., & Oral, A., (2004). 50 nm Hall sensors for room temperature scanning Hall probe microscopy. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , vol.43, no.2, 777-778.

SANDHU, ADARSH Et Al. "50 nm Hall sensors for room temperature scanning Hall probe microscopy," JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , vol.43, no.2, 777-778, 2004

SANDHU, ADARSH Et Al. "50 nm Hall sensors for room temperature scanning Hall probe microscopy." JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , vol.43, no.2, pp.777-778, 2004

SANDHU, A. Et Al. (2004) . "50 nm Hall sensors for room temperature scanning Hall probe microscopy." JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , vol.43, no.2, pp.777-778.

@article{article, author={ADARSH SANDHU Et Al. }, title={50 nm Hall sensors for room temperature scanning Hall probe microscopy}, journal={JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS}, year=2004, pages={777-778} }