S. Ilday Et Al. , "Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization," APPLIED SURFACE SCIENCE , vol.318, pp.256-261, 2014
Ilday, S. Et Al. 2014. Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization. APPLIED SURFACE SCIENCE , vol.318 , 256-261.
Ilday, S., Nogay, G., & TURAN, R., (2014). Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization. APPLIED SURFACE SCIENCE , vol.318, 256-261.
Ilday, Serim, Gizem Nogay, And RAŞİT TURAN. "Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization," APPLIED SURFACE SCIENCE , vol.318, 256-261, 2014
Ilday, Serim Et Al. "Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization." APPLIED SURFACE SCIENCE , vol.318, pp.256-261, 2014
Ilday, S. Nogay, G. And TURAN, R. (2014) . "Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization." APPLIED SURFACE SCIENCE , vol.318, pp.256-261.
@article{article, author={Serim Ilday Et Al. }, title={Spectroscopic ellipsometry study of Si nanocrystals embedded in a SiOx matrix: Modeling and optical characterization}, journal={APPLIED SURFACE SCIENCE}, year=2014, pages={256-261} }