Basa, P. Et Al. 2008. Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. APPLIED SURFACE SCIENCE , vol.254, no.12 , 3626-3629.

Basa, P., Alagoz, A. S., Lohner, T., Kulakci, M., TURAN, R., Nagy, K., ... Horvath, Z. J.(2008). Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. APPLIED SURFACE SCIENCE , vol.254, no.12, 3626-3629.

Basa, P. Et Al. "Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals," APPLIED SURFACE SCIENCE , vol.254, no.12, 3626-3629, 2008

Basa, P. Et Al. "Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals." APPLIED SURFACE SCIENCE , vol.254, no.12, pp.3626-3629, 2008

Basa, P. Et Al. (2008) . "Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals." APPLIED SURFACE SCIENCE , vol.254, no.12, pp.3626-3629.

@article{article, author={P. Basa Et Al. }, title={Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals}, journal={APPLIED SURFACE SCIENCE}, year=2008, pages={3626-3629} }